• DocumentCode
    1893960
  • Title

    Advanced technology transfer through empowered cross-functional teams-Case study: The team response to a pre-production IC fabrication process yield loss

  • Author

    Crandell, Tom ; Davis, Chris ; Butler, John

  • Author_Institution
    Harris Semiconductor, Melbourne, FL, USA
  • fYear
    1993
  • fDate
    18-19 May 1993
  • Firstpage
    74
  • Lastpage
    79
  • Abstract
    The use of empowered cross-functional teams to transfer new technologies is compared with the traditional serial approach. The effectiveness of such teams is demonstrated through a case study which describes the rapid detection and correction of a sudden yield loss in a newly developed, advanced bipolar IC process
  • Keywords
    integrated circuit manufacture; management; quality control; technology transfer; IC fabrication process yield loss; TQM approach; advanced bipolar IC process; advanced technology transfer; serial approach; team response; total quality management; Bipolar integrated circuits; Consumer electronics; Customer satisfaction; Manufacturing processes; Marketing and sales; Production; Quality management; Scheduling; Technology transfer; Total quality management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    University/Government/Industry Microelectronics Symposium, 1993., Proceedings of the Tenth Biennial
  • Conference_Location
    Research Triangle Park, NC
  • ISSN
    0749-6877
  • Print_ISBN
    0-7803-0990-1
  • Type

    conf

  • DOI
    10.1109/UGIM.1993.297033
  • Filename
    297033