Title :
Advanced technology transfer through empowered cross-functional teams-Case study: The team response to a pre-production IC fabrication process yield loss
Author :
Crandell, Tom ; Davis, Chris ; Butler, John
Author_Institution :
Harris Semiconductor, Melbourne, FL, USA
Abstract :
The use of empowered cross-functional teams to transfer new technologies is compared with the traditional serial approach. The effectiveness of such teams is demonstrated through a case study which describes the rapid detection and correction of a sudden yield loss in a newly developed, advanced bipolar IC process
Keywords :
integrated circuit manufacture; management; quality control; technology transfer; IC fabrication process yield loss; TQM approach; advanced bipolar IC process; advanced technology transfer; serial approach; team response; total quality management; Bipolar integrated circuits; Consumer electronics; Customer satisfaction; Manufacturing processes; Marketing and sales; Production; Quality management; Scheduling; Technology transfer; Total quality management;
Conference_Titel :
University/Government/Industry Microelectronics Symposium, 1993., Proceedings of the Tenth Biennial
Conference_Location :
Research Triangle Park, NC
Print_ISBN :
0-7803-0990-1
DOI :
10.1109/UGIM.1993.297033
