DocumentCode
1894020
Title
Fatigue life prediction of solder material: effect of ramp time, hold time and temperature
Author
Vaynman, Semyon
Author_Institution
Basic Ind. Res. Lab., Northwestern Univ., Evanston, IL, USA
fYear
1990
fDate
20-23 May 1990
Firstpage
505
Abstract
The influence of factors such as ramp time, hold time, and temperature on isothermal fatigue of low-tin lead-based solder is investigated. Ways to extrapolate fatigue life are demonstrated. Decrease of frequency below 10-2 Hz is shown to lead to the reduction in the number of cycles to failure. The relation between N f and frequency may be described by Eckel´s relation. The effect of frequency is a function of strain range; therefore, the frequency-modified Coffin-Manson relation is not applicable to this solder at strains studied. Hold time dramatically reduces the number of cycles to failure and leads to the saturation in the N f . The method to calculate this limit is developed. The activation energy is a function of cycling conditions. High strain rates and high strain ranges lead to mixed transgranular-intergranular fracture. Activation energy, which is 24-26 kJ/mol. at low strain ranges and at all strain ranges with low strain rates (slow cycling or hold time in the cycle), can be used for isothermal fatigue data extrapolation of this solder
Keywords
fatigue; lead alloys; materials testing; soldering; Eckel´s relation; PbSn; activation energy; cycling conditions; data extrapolation; fatigue life; frequency; hold time; isothermal fatigue; ramp time; solder material; strain range; strain rates; temperature; transgranular-intergranular fracture; Capacitive sensors; Electronic packaging thermal management; Fatigue; Frequency; Isothermal processes; Lead; Temperature; Tensile strain; Tensile stress; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location
Las Vegas, NV
Type
conf
DOI
10.1109/ECTC.1990.122235
Filename
122235
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