DocumentCode :
1894102
Title :
A multilevel DRAM with hierarchical bitlines and serial sensing
Author :
Cockburn, Bruce F. ; Tapia, Jesís Hernández ; Elliott, Duncan G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, AB, Canada
fYear :
2003
fDate :
28-29 July 2003
Firstpage :
14
Lastpage :
19
Abstract :
We propose a multilevel DRAM (MLDRAM) with serial sensing that has lower area overhead than designs that use single-step, flash conversion sensing. The new design exploits hierarchical, multidivided bitlines to offset the reduction in noise margins caused by multilevel signaling and thereby better preserve the signal-to-noise ratio. The multiple sensing operations required to recover multilevel data are performed serially to re-use sense amplifiers and hence minimize the area overhead of the peripheral circuitry at the cost of increased total read time. In a variation of the proposed design, a subset of the addressed row of cells is read in one sensing step while the remaining cells are recovered later in further sensing steps.
Keywords :
DRAM chips; amplifiers; computer peripheral equipment; noise; signal processing; flash conversion sensing; hierarchical bitlines; multidivided bitlines; multilevel DRAM; multilevel data; multiple sensing operations; noise margins reduction; peripheral circuitry; sense amplifiers; serial data sensing; signal-to-noise ratio; Capacitors; Circuit noise; Costs; Noise reduction; Operational amplifiers; Production; Random access memory; Signal design; Signal to noise ratio; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Memory Technology, Design and Testing, 2003. Records of the 2003 International Workshop on
ISSN :
1087-4852
Print_ISBN :
0-7695-2004-9
Type :
conf
DOI :
10.1109/MTDT.2003.1222355
Filename :
1222355
Link To Document :
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