• DocumentCode
    1894102
  • Title

    A multilevel DRAM with hierarchical bitlines and serial sensing

  • Author

    Cockburn, Bruce F. ; Tapia, Jesís Hernández ; Elliott, Duncan G.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, AB, Canada
  • fYear
    2003
  • fDate
    28-29 July 2003
  • Firstpage
    14
  • Lastpage
    19
  • Abstract
    We propose a multilevel DRAM (MLDRAM) with serial sensing that has lower area overhead than designs that use single-step, flash conversion sensing. The new design exploits hierarchical, multidivided bitlines to offset the reduction in noise margins caused by multilevel signaling and thereby better preserve the signal-to-noise ratio. The multiple sensing operations required to recover multilevel data are performed serially to re-use sense amplifiers and hence minimize the area overhead of the peripheral circuitry at the cost of increased total read time. In a variation of the proposed design, a subset of the addressed row of cells is read in one sensing step while the remaining cells are recovered later in further sensing steps.
  • Keywords
    DRAM chips; amplifiers; computer peripheral equipment; noise; signal processing; flash conversion sensing; hierarchical bitlines; multidivided bitlines; multilevel DRAM; multilevel data; multiple sensing operations; noise margins reduction; peripheral circuitry; sense amplifiers; serial data sensing; signal-to-noise ratio; Capacitors; Circuit noise; Costs; Noise reduction; Operational amplifiers; Production; Random access memory; Signal design; Signal to noise ratio; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design and Testing, 2003. Records of the 2003 International Workshop on
  • ISSN
    1087-4852
  • Print_ISBN
    0-7695-2004-9
  • Type

    conf

  • DOI
    10.1109/MTDT.2003.1222355
  • Filename
    1222355