DocumentCode
1894137
Title
Applying software process to Virtual Instrument based test program set development
Author
Rabe, Doug ; Miller, John
Author_Institution
Autom. Sci. Group, CACI, San Antonio, TX, USA
fYear
1997
fDate
22-25 Sep 1997
Firstpage
194
Lastpage
197
Abstract
Virtual Instrument (VI) based test program development systems, as exemplified by National Instruments´ LabVIEW, provide very powerful design capture fools that allow the test program set (TPS) developer to rapidly prototype test strategies. As usual, in great power lies danger. In this case the danger is the ease of which VIs are reused. While code reuse is a desired feature, unintentional modifications to common VIs, name clashes, and library corruption are all potential headaches resulting from uncontrolled changes to VIs stored in shared libraries. Undetected “Spontaneous Upgrades” to library components can ruin a maintainer´s day when the program loads with broken wires. Developing quality software requires software quality. This paper provides recommended practices to address the Key Practice Areas (KPAs) defined in the Software Engineering Institute´s (SEI) Capability Maturity Model (CMM) in the context of TPS development in LabVIEW. Repository management procedures such as check-in check-out and change tracking and documentation are described
Keywords
automatic test equipment; automatic test software; electronic equipment testing; military equipment; printed circuit testing; programming environments; software quality; software reusability; Capability Maturity Model; DOD; LabVIEW; National Instruments; Repository management procedures; Software Engineering Institute; TPS development; Virtual Instrument; change tracking; clashes; code reuse; documentation; library corruption; software process; software quality; test program set development; Capability maturity model; Instruments; Software engineering; Software libraries; Software prototyping; Software quality; Software testing; System testing; Virtual prototyping; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
Conference_Location
Anaheim, CA
Print_ISBN
0-7803-4162-7
Type
conf
DOI
10.1109/AUTEST.1997.633610
Filename
633610
Link To Document