• DocumentCode
    1894137
  • Title

    Applying software process to Virtual Instrument based test program set development

  • Author

    Rabe, Doug ; Miller, John

  • Author_Institution
    Autom. Sci. Group, CACI, San Antonio, TX, USA
  • fYear
    1997
  • fDate
    22-25 Sep 1997
  • Firstpage
    194
  • Lastpage
    197
  • Abstract
    Virtual Instrument (VI) based test program development systems, as exemplified by National Instruments´ LabVIEW, provide very powerful design capture fools that allow the test program set (TPS) developer to rapidly prototype test strategies. As usual, in great power lies danger. In this case the danger is the ease of which VIs are reused. While code reuse is a desired feature, unintentional modifications to common VIs, name clashes, and library corruption are all potential headaches resulting from uncontrolled changes to VIs stored in shared libraries. Undetected “Spontaneous Upgrades” to library components can ruin a maintainer´s day when the program loads with broken wires. Developing quality software requires software quality. This paper provides recommended practices to address the Key Practice Areas (KPAs) defined in the Software Engineering Institute´s (SEI) Capability Maturity Model (CMM) in the context of TPS development in LabVIEW. Repository management procedures such as check-in check-out and change tracking and documentation are described
  • Keywords
    automatic test equipment; automatic test software; electronic equipment testing; military equipment; printed circuit testing; programming environments; software quality; software reusability; Capability Maturity Model; DOD; LabVIEW; National Instruments; Repository management procedures; Software Engineering Institute; TPS development; Virtual Instrument; change tracking; clashes; code reuse; documentation; library corruption; software process; software quality; test program set development; Capability maturity model; Instruments; Software engineering; Software libraries; Software prototyping; Software quality; Software testing; System testing; Virtual prototyping; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-4162-7
  • Type

    conf

  • DOI
    10.1109/AUTEST.1997.633610
  • Filename
    633610