Title :
Anisotropic dielectric substrate as thin dielectric resonator
Author :
Bovtun, V. ; Pashkov, V. ; Kempa, Martin ; Molchanov, Vitaliy ; Kamba, S. ; Poplavko, Yuriy ; Yakymenko, Yuriy
Author_Institution :
Inst. of Phys., Prague, Czech Republic
Abstract :
Dielectric resonances of thin anisotropic substrates are analyzed. It is shown that substrate orientation in a cylindrical shielding cavity influences the field distribution, coupling and excitation conditions, resonance frequency and quality factor of its TE01δ resonance mode. The HE11δ mode is split in two resonances whose intensities depend on substrate orientation and thickness. The optimal ways of anisotropic substrate parameters characterization are discussed.
Keywords :
Q-factor; dielectric resonance; dielectric resonators; electromagnetic shielding; coupling conditions; cylindrical shielding cavity; dielectric resonances; excitation conditions; field distribution; quality factor; resonance frequency; resonance mode; substrate orientation; substrate thickness; thin anisotropic substrate parameters characterization; thin dielectric resonator; Cavity resonators; Couplings; Dielectrics; Helium; Permittivity; Resonant frequency; Substrates;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2012 22nd International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
978-1-4673-1199-1
