• DocumentCode
    1894156
  • Title

    Anisotropic dielectric substrate as thin dielectric resonator

  • Author

    Bovtun, V. ; Pashkov, V. ; Kempa, Martin ; Molchanov, Vitaliy ; Kamba, S. ; Poplavko, Yuriy ; Yakymenko, Yuriy

  • Author_Institution
    Inst. of Phys., Prague, Czech Republic
  • fYear
    2012
  • fDate
    10-14 Sept. 2012
  • Firstpage
    573
  • Lastpage
    574
  • Abstract
    Dielectric resonances of thin anisotropic substrates are analyzed. It is shown that substrate orientation in a cylindrical shielding cavity influences the field distribution, coupling and excitation conditions, resonance frequency and quality factor of its TE01δ resonance mode. The HE11δ mode is split in two resonances whose intensities depend on substrate orientation and thickness. The optimal ways of anisotropic substrate parameters characterization are discussed.
  • Keywords
    Q-factor; dielectric resonance; dielectric resonators; electromagnetic shielding; coupling conditions; cylindrical shielding cavity; dielectric resonances; excitation conditions; field distribution; quality factor; resonance frequency; resonance mode; substrate orientation; substrate thickness; thin anisotropic substrate parameters characterization; thin dielectric resonator; Cavity resonators; Couplings; Dielectrics; Helium; Permittivity; Resonant frequency; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Telecommunication Technology (CriMiCo), 2012 22nd International Crimean Conference
  • Conference_Location
    Sevastopol, Crimea
  • Print_ISBN
    978-1-4673-1199-1
  • Type

    conf

  • Filename
    6336100
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1894156