DocumentCode
1894166
Title
A fault primitive based analysis of linked faults in RAMs
Author
Al-Ars, Zaid ; Hamdioui, Said ; Van de Goor, Ad J.
Author_Institution
Fac. of Inf. Technol. Syst., Delft Univ. of Technol., Netherlands
fYear
2003
fDate
28-29 July 2003
Firstpage
33
Lastpage
39
Abstract
Linked faults are very important for memory testing because they reduce the fault coverage of the tests. Their analysis has proven to be a source for new memory tests, characterized by an increased fault coverage for a given test time. This paper presents an analysis of linked faults, based on the concept of fault primitives, such that the whole space of linked faults is investigated, accounted for and validated. The paper also introduces a systematic way to develop tests for such faults.
Keywords
fault diagnosis; logic testing; random-access storage; RAM; fault primitives; functional fault models; linked faults analysis; march tests; memory testing; single cell linked faults; Design methodology; Electrical fault detection; Information technology; Laboratories; Random access memory; Read-write memory; System testing; Systems engineering and theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design and Testing, 2003. Records of the 2003 International Workshop on
ISSN
1087-4852
Print_ISBN
0-7695-2004-9
Type
conf
DOI
10.1109/MTDT.2003.1222358
Filename
1222358
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