Title :
Applying CIM and TQM to a student run integrated circuit factory
Author :
Fuller, L.F. ; Waldrop, P.C. ; Grube, S.J. ; Young, L.M.
Author_Institution :
Microelectron. Eng., Rochester Inst. of Technol., NY, USA
Abstract :
Rochester Institute of Technology (RIT) has received a five year grant from IBM through an IBM total quality management (TQM) competition. Among the several projects funded by this grant is a project entitled Six Sigma Process Capability in Student-Run IC Factory. RIT is in the first year of this project and is involved in defining the process capability baseline from data collected for the past several years of student-run factory operation. The methodology to improve the quality of the student-run factor is described in detail. It was found that none of the processes is as good as a Three Sigma process and some are equivalent to One Sigma or less. Action plans for improving these processes have been implemented
Keywords :
computer integrated manufacturing; integrated circuit manufacture; project management; quality control; IBM total quality management; TQM; integrated circuit factory; six sigma process capability; student-run factory operation; Computer integrated manufacturing; Gaussian distribution; Laboratories; Manufacturing processes; Microelectronics; Production facilities; Production systems; Project management; Six sigma; Total quality management;
Conference_Titel :
University/Government/Industry Microelectronics Symposium, 1993., Proceedings of the Tenth Biennial
Conference_Location :
Research Triangle Park, NC
Print_ISBN :
0-7803-0990-1
DOI :
10.1109/UGIM.1993.297044
