Applying CIM and TQM to a student run integrated circuit factory

Author

Fuller, L.F. ; Waldrop, P.C. ; Grube, S.J. ; Young, L.M.

Author_Institution

Microelectron. Eng., Rochester Inst. of Technol., NY, USA

fYear

1993

fDate

18-19 May 1993

Firstpage

17

Lastpage

22

Abstract

Rochester Institute of Technology (RIT) has received a five year grant from IBM through an IBM total quality management (TQM) competition. Among the several projects funded by this grant is a project entitled Six Sigma Process Capability in Student-Run IC Factory. RIT is in the first year of this project and is involved in defining the process capability baseline from data collected for the past several years of student-run factory operation. The methodology to improve the quality of the student-run factor is described in detail. It was found that none of the processes is as good as a Three Sigma process and some are equivalent to One Sigma or less. Action plans for improving these processes have been implemented

Keywords

computer integrated manufacturing; integrated circuit manufacture; project management; quality control; IBM total quality management; TQM; integrated circuit factory; six sigma process capability; student-run factory operation; Computer integrated manufacturing; Gaussian distribution; Laboratories; Manufacturing processes; Microelectronics; Production facilities; Production systems; Project management; Six sigma; Total quality management;

fLanguage

English

Publisher

ieee

Conference_Titel

University/Government/Industry Microelectronics Symposium, 1993., Proceedings of the Tenth Biennial

Conference_Location

Research Triangle Park, NC

ISSN

0749-6877

Print_ISBN

0-7803-0990-1

Type

conf

DOI

10.1109/UGIM.1993.297044

Filename

297044