• DocumentCode
    1894341
  • Title

    Activity detection of a PSK in unknown white gaussian noise: optimal and suboptimal invariant detectors

  • Author

    Tadaion, A.A. ; Gazor, S. ; Derakhtian, M. ; Aref, M.R.

  • Author_Institution
    Dept. of Electr. Eng., Sharif Univ., Tehran
  • fYear
    2005
  • fDate
    17-20 July 2005
  • Firstpage
    597
  • Lastpage
    602
  • Abstract
    We propose three solutions for the detection of the activity of phase shift keying (PSK) signals in additive white Gaussian noise environment. The symbol sequence, the complex amplitude of the signal and the noise variance are assumed to be unknown. We show that the uniformly most powerful invariant (UMPI) test does exist only if the signal-to-noise ratio (SNR) is known. We use this UMPI test in order to obtain an upper-bound performance for the evaluation of invariant detectors. We also propose two suboptimal tests namely, the generalized likelihood ratio (GLR) test, and the average likelihood ratio (ALR)-GLR test. It turns out that the computational complexity (CC) of these detectors increases exponentially with the increase of the sequence length. Therefore, we suggest a suboptimal computationally efficient implementation of the GLR. This implementation requires only 0.02 dB higher SNR in order to perform as good as the GLR. Furthermore, we develop a new inexpensive detector for the case of binary PSK (BPSK) signals, namely generalized energy detector (GED). Simulation results illustrate and compare the performance and the efficiency of these methods
  • Keywords
    AWGN; binary sequences; maximum likelihood detection; phase shift keying; ALR; GED; GLR; UMPI; additive white Gaussian noise environment; average likelihood ratio test; binary PSK signal detection; generalized energy detector; generalized likelihood ratio test; invariant detector; phase shift keying; symbol sequence; uniformly most powerful invariant test; upper-bound performance; Additive white noise; Computational complexity; Detectors; Gaussian noise; Noise level; Phase detection; Phase shift keying; Signal to noise ratio; Testing; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Statistical Signal Processing, 2005 IEEE/SP 13th Workshop on
  • Conference_Location
    Novosibirsk
  • Print_ISBN
    0-7803-9403-8
  • Type

    conf

  • DOI
    10.1109/SSP.2005.1628665
  • Filename
    1628665