• DocumentCode
    1894358
  • Title

    Influence on the Stability of the Underground Cavity by the Buried Depth

  • Author

    Gao Bing-li

  • Author_Institution
    Sch. of Archit. & Civil Eng., Xi´an Univ. of Sci. & Technol., Xi´an, China
  • Volume
    1
  • fYear
    2012
  • fDate
    23-25 March 2012
  • Firstpage
    55
  • Lastpage
    58
  • Abstract
    Longyou Grottoes, with the characteristics of the structure of oblique roof plus rock pillar, big excavation, shallow burial and not good surrounding rock, exists the problem of instability. In order to protect it chronically, it is necessary to carry out varied researches, such as the study of the influence on the stability of the underground cavity of horizontal roof by the buried depth. In fact, the buried depth is an important factor that impacts the stability of the horizontal roof underground cavity. The elastic-plastic finite element method is utilized to compare and analyze some factors influenced by the buried depth, such as the displacement and stress field and the damaged area of the surrounding rock. It is concluded in the paper that the buried depth. The result helps to further understand the deformation and failure regularities of some horizontal roof cavities or the left open stope in the horizontal layer, and to assess their stabilities.
  • Keywords
    deformation; elasticity; failure (mechanical); finite element analysis; geotechnical engineering; mechanical stability; plasticity; rocks; structural engineering; Longyou Grottoes; buried depth; damaged area; deformation regularity; elastic-plastic finite element method; excavation; failure regularity; horizontal roof underground cavity; instability problem; oblique-roof structure; rock pillar structure; shallow burial; stress field; underground cavity stability; Analytical models; Cavity resonators; Finite element methods; Floors; Numerical models; Stability analysis; Stress; Buried Depth; Stability; Underground Cavities;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Electronics Engineering (ICCSEE), 2012 International Conference on
  • Conference_Location
    Hangzhou
  • Print_ISBN
    978-1-4673-0689-8
  • Type

    conf

  • DOI
    10.1109/ICCSEE.2012.500
  • Filename
    6187827