Title :
An optical comparator for particle detection
Author :
Sander, David ; Abshire, Pamela
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD
Abstract :
Thresholding is an important data reduction technique used to eliminate unwanted information, and is commonly used in applications such as particle detection for lab-on-a-chip systems. This work presents a novel optical comparator which incorporates a photosensitive area into a five transistor comparator to perform thresholding. The optically active area is formed by enlarging the drain substrate p-n junction of each of the cross coupled NMOS transistors, and exposing one of them to the light, while shielding the other with metal for symmetry and dark current suppression. The cross-coupled NMOS transistors provide positive feedback to enhance detection speed and latch the result, while the PMOS input transistors provide a biasing mechanism to set an optical threshold. The device was fabricated and tested in a commercially available 3-metal 2-poly CMOS process. Results show that the device can reliably discriminate an optical signal of power on the order of the defined threshold.
Keywords :
CMOS integrated circuits; MOSFET; comparators (circuits); data reduction; lab-on-a-chip; optical sensors; particle detectors; CMOS process; NMOS transistors; PMOS input transistors; data reduction; drain substrate p-n junction; lab-on-a-chip systems; optical comparator; particle detection; thresholding; transistor comparator; Biomedical optical imaging; CMOS process; Lighting; MOSFETs; Optical coupling; Optical feedback; Optical filters; Optical sensors; Quantization; Sensor phenomena and characterization;
Conference_Titel :
Sensors, 2008 IEEE
Conference_Location :
Lecce
Print_ISBN :
978-1-4244-2580-8
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2008.4716452