Title :
Memories response to MBU and Semi-empirical approach for SEE rate calculation
Author :
Petit, S. ; David, J.P. ; Falguére, D. ; Duzellier, S. ; Inguimbert, C. ; Nuns, T. ; Ecoffet, R.
Author_Institution :
ONERA, Toulouse
Abstract :
This paper deals with SEE rate prediction and proposes a semi-empirical approach that makes no use of the RPP concept. The investigation is based on a reduced set of ground data and SEU/MBU results are compared with inflight data obtained on memories on-board ICARE (SAC-C orbit). Lastly, 2D mixed-mode simulations complete this study and provide first insight to understand the observed behaviour.
Keywords :
random-access storage; 2D mixed-mode simulations; DRAM; SAC-C orbit; SRAM; memories response; multiple bit upset; on-board ICARE; semiempirical approach; Charge measurement; Circuits; Current measurement; Data analysis; Filtering; Geometry; Ionization; Modems; Protons; Testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Conference_Location :
Cap d´Agde
Print_ISBN :
978-0-7803-9502-2
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2005.4365565
