Title :
Laser-Induced Latchup Screening and Mitigation in CMOS Devices
Author :
McMorrow, Dale ; Buchner, Stephen ; Baze, Mark ; Bartholet, Bill ; Katz, Richard ; O´Bryan, Martha ; Poivey, Christian ; LaBel, Kenneth A. ; Ladbury, Ray ; Maher, Mike ; Sexton, Fred
Author_Institution :
Naval Res. Lab., Washington
Abstract :
This paper describes application of the pulsed laser approach for identifying latch-up sensitive regions in CMOS circuitry. The utility of this approach for preliminary latchup screening of both COTS and space-qualified parts for applications in radiation environments is described. An application of hardening-by-design principles in which a space qualified CMOS product is modified, based on the pulsed laser results, to be latchup immune is presented in detail. The design modifications are described.
Keywords :
CMOS integrated circuits; high-speed optical techniques; CMOS circuitry; hardening-by-design principles; latch-up sensitive regions; latchup screening; pulsed laser approach; single-event latchup; CMOS integrated circuits; Circuit testing; Integrated circuit interconnections; NASA; Optical pulses; Power supplies; Pulse circuits; Pulsed laser deposition; Radiation hardening; Switches; CMOS; laser; latchup; micro-latchup; picosecond; single-event effects;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Conference_Location :
Cap d´Agde
Print_ISBN :
978-0-7803-9502-2
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2005.4365569
