Laser-Induced Latchup Screening and Mitigation in CMOS Devices

Author

McMorrow, Dale ; Buchner, Stephen ; Baze, Mark ; Bartholet, Bill ; Katz, Richard ; O´Bryan, Martha ; Poivey, Christian ; LaBel, Kenneth A. ; Ladbury, Ray ; Maher, Mike ; Sexton, Fred

Author_Institution

Naval Res. Lab., Washington

fYear

2005

fDate

19-23 Sept. 2005

Abstract

This paper describes application of the pulsed laser approach for identifying latch-up sensitive regions in CMOS circuitry. The utility of this approach for preliminary latchup screening of both COTS and space-qualified parts for applications in radiation environments is described. An application of hardening-by-design principles in which a space qualified CMOS product is modified, based on the pulsed laser results, to be latchup immune is presented in detail. The design modifications are described.

Keywords

CMOS integrated circuits; high-speed optical techniques; CMOS circuitry; hardening-by-design principles; latch-up sensitive regions; latchup screening; pulsed laser approach; single-event latchup; CMOS integrated circuits; Circuit testing; Integrated circuit interconnections; NASA; Optical pulses; Power supplies; Pulse circuits; Pulsed laser deposition; Radiation hardening; Switches; CMOS; laser; latchup; micro-latchup; picosecond; single-event effects;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on

Conference_Location

Cap d´Agde

ISSN

0379-6566

Print_ISBN

978-0-7803-9502-2

Electronic_ISBN

0379-6566

Type

conf

DOI

10.1109/RADECS.2005.4365569

Filename

4365569