Title :
Dielectric behaviour of insulating materials under liquid nitrogen
Author :
Husain, E. ; Mohsin, M.M. ; Masood, A. ; Zuberi, M.U.
Author_Institution :
Dept. of Electr. Eng., Aligarh Muslim Univ., India
Abstract :
In practical HTSC devices, equipment and systems use of both LN 2 (liquid nitrogen) and CGN2 (cryogenic nitrogen) is almost essential. Both LN2 and CGN2 are used not only as a coolant but also as an insulating material. In the present study an attempt has been made to study the dielectric behavior of solid insulating materials dipped in LN2 as regards to change in loss index
Keywords :
cryogenics; electric breakdown; electric strength; insulating materials; insulation testing; HTSC devices; breakdown strength measurement; coolant; cryogenic nitrogen; dielectric behavior; insulating material; liquid nitrogen; loss index change; solid insulating materials; Conducting materials; Cryogenics; Dielectric liquids; Dielectric losses; Dielectric materials; Dielectrics and electrical insulation; Nitrogen; Permittivity; Solids; Temperature;
Conference_Titel :
Electrical Insulation Conference and Electrical Manufacturing & Coil Winding Conference, 2001. Proceedings
Conference_Location :
Cincinnati, OH
Print_ISBN :
0-7803-7180-1
DOI :
10.1109/EEIC.2001.965679