Title :
Using scattering parameters to characterize EMI filters
Author :
Wang, Shuo ; Lee, F.C. ; Odendaal, W.G.
Author_Institution :
Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
In this paper, the EMI filter is first characterized by S-parameters. Based on this S-parameters model, the insertion voltage gain of EMI filters with arbitrary source and load impedances are derived. Experiments are carried out to verify this approach. The S-parameters with current bias are also measured to characterize the EMI filter under current bias conditions. The concept of waves is then used to interpret the impedance requirement of the filters. Finally, the predictions on filter insertion voltage gain with practical source impedances are compared with the results from the measurement and the effects of the source impedances are analyzed.
Keywords :
S-parameters; electric current measurement; electric impedance; electromagnetic interference; interference filters; signal flow graphs; EMI filters; S-parameters model; current bias; electromagnetic interference; filter insertion voltage gain; insertion loss; load impedances; scattering parameters; signal flow graph; spectrum; Circuits; Electromagnetic interference; Hafnium; Impedance; Insertion loss; Nonlinear filters; Power electronics; Power supplies; Scattering parameters; Voltage;
Conference_Titel :
Power Electronics Specialists Conference, 2004. PESC 04. 2004 IEEE 35th Annual
Print_ISBN :
0-7803-8399-0
DOI :
10.1109/PESC.2004.1355759