DocumentCode :
1895073
Title :
Laser-induced fluorescence technique for measuring damage to a fluorescent lamp electrode
Author :
Yunfen Ji ; Korenowski, G. ; Davis, Ronald W.
Author_Institution :
Rensselaer Polytech. Inst., Troy, NY, USA
fYear :
1997
fDate :
19-22 May 1997
Firstpage :
247
Abstract :
Summary form only given, as follows. The proliferation of solid-state electronic ballasts for fluorescent lamps has led to many different starting and operating scenarios for these lamps. Because these scenarios often differ from those described in relevant ANSI standards, the effects on the operating lives of lamps is not known. This paper describes a pilot study that used a laser-induced fluorescence (LIF) technique to directly measure the rate of barium loss from a fluorescent lamp electrode under a variety of starting and operating parameters. The experimental results are provided and the potential applications of the technique for commercial lighting products are discussed.
Keywords :
ANSI standards; electrodes; fluorescence; fluorescent lamps; lamp accessories; photoluminescence; starting; ANSI standards; Ba; Ba loss; commercial lighting products; fluorescent lamp electrode; fluorescent lamps; laser-induced fluorescence technique; operating lives; operating scenarios; solid-state electronic ballasts; starting scenarios; Barium; Cooling; Electrical resistance measurement; Electrodes; Fluorescence; Fluorescent lamps; Glow discharges; Plasma measurements; Plasma temperature; Radiometry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
Conference_Location :
San Diego, CA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-3990-8
Type :
conf
DOI :
10.1109/PLASMA.1997.604988
Filename :
604988
Link To Document :
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