DocumentCode
1895081
Title
Cognitive OFDMA: Exploring a new FFT based detection technique for opportunistic usage
Author
Gen, Ibrahim Demiro ; Birol, Asli ; Aldrmaz, S. ; Arslan, Huseyin ; Durak, Lutfiye
Author_Institution
Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
fYear
2010
fDate
10-14 Jan. 2010
Firstpage
344
Lastpage
347
Abstract
In this paper, a new opportunity search technique is introduced for OFDMA based Cognitive Radio systems. In, which forms a basis for this study, the conventional opportunity search method was utilized for various subcarrier allocations where power spectral density calculations were used. Since all possible spectral gaps could not be found using the conventional technique, in order to increase the detection rate, a new technique is presented in this paper, which involves more than just determining the power in a frequency band. In the proposed technique, the opportunity search is done at the receiver part with synchronization stage and utilizing FFT calculations after removing cyclic prefix. Also it has been shown that by using the proposed technique all opportunities can be found when AWGN channel is considered without any impairments such as frequency offset and delay. Performance of the proposed technique is presented in comparison with the the conventional PSD method, and effects of OFDM impairments are studied individually. Simulation results show the superiority of the new technique in terms of true detection rates.
Keywords
AWGN channels; OFDM modulation; cognitive radio; fast Fourier transforms; frequency division multiple access; AWGN channel; FFT based detection technique; cognitive OFDMA; cognitive radio systems; opportunity search method; power spectral density calculations; Baseband; Chromium; Cognitive radio; Fading; Frequency synchronization; Interference; Scattering; Search methods; Timing; USA Councils; Cognitive radio systems; OFDMA; opportunity search; subcarrier allocation;
fLanguage
English
Publisher
ieee
Conference_Titel
Radio and Wireless Symposium (RWS), 2010 IEEE
Conference_Location
New Orleans, LA
Print_ISBN
978-1-4244-4725-1
Electronic_ISBN
978-1-4244-4726-8
Type
conf
DOI
10.1109/RWS.2010.5434260
Filename
5434260
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