Title : 
Developments in modern high power semiconductor devices
         
        
            Author : 
Shigekane, Hisao ; Kirihata, Humiaki ; Uchida, Yoshiyuki
         
        
            Author_Institution : 
Fuji Electric Co. Ltd., Nagano, Japan
         
        
        
        
        
        
            Abstract : 
The present state and future direction of high-power semiconductor devices (⩾500 kVA) are discussed. To characterize the best choice of power devices, a figure of merit is proposed that takes into account thermal and structural factors of the package. Using this parameter, bipolar junction transistors, insulated-gate bipolar transistors (IGBTs), and gate-turn-off thyristors (GTOs) are compared. A realistic approach for a high-power device superior to a GTO is developed using a flat package type similar to that for GTOs. A 2500-V, 100-A IGBT, assembled into an advanced flat package called a microstack, has been designed and demonstrated. This technology can also be applied to high-power MOS gate-controlled devices for high-power inverters over one MVA
         
        
            Keywords : 
bipolar transistors; insulated gate bipolar transistors; packaging; power electronics; power integrated circuits; power transistors; semiconductor devices; thyristors; 100 A; 2500 V; 500 kVA; advanced flat package; bipolar junction transistors; figure of merit; gate-turn-off thyristors; high power semiconductor devices; high-power MOS gate-controlled devices; high-power inverters; insulated-gate bipolar transistors; microstack; power ratings; structural factors; thermal factors; Circuits; Commercialization; History; Insulated gate bipolar transistors; Inverters; Packaging; Power semiconductor devices; Switching frequency; Thyristors; Voltage;
         
        
        
        
            Conference_Titel : 
Power Semiconductor Devices and ICs, 1993. ISPSD '93., Proceedings of the 5th International Symposium on
         
        
            Conference_Location : 
Monterey, CA
         
        
        
            Print_ISBN : 
0-7803-1313-5
         
        
        
            DOI : 
10.1109/ISPSD.1993.297099