Title :
Modification of spontaneous emission and local-field effects in dielectrics
Author :
Schuurmans, F.J.P. ; de Lang, D.T.N. ; Wegdam, G.H. ; Sprik, R. ; Lagendijk, Ad
Author_Institution :
Van der Waals-Zeeman Inst., Amsterdam Univ., Netherlands
Abstract :
Summary form only given.To determine the refractivity in situ, a time-resolved interferometric technique is used. The technique is based on cross correlating a reference pulse and a transmitted pulse from a 70-fs Ti:sapphire laser with the use of a commercially available Fourier-transform spectrometer. This approach enables us to obtain the pulse delay through the dense gas with 10-fs resolution in the refractive-index change. The resulting molecule Eu(fod), is optically excited with a pulsed, tripled Nd:YAG laser at 355 nm, and luminescence is detected in the red (614 nm). Radiative decay rates are in the convenient ms range and are recorded with a multichannel scaler. We present measurements on the radiative lifetime of Eu (fod), in supercritical CO/sub 2/ with varying refractive index. Different local field models are discussed.
Keywords :
carbon compounds; excited states; high-speed optical techniques; refractive index; spontaneous emission; 355 nm; 614 nm; 70 fs; CO/sub 2/; YAG:Nd; YAl5O12:Nd; commercially available Fourier-transform spectrometer; cross correlating; dense gas; dielectrics; fs Ti:sapphire laser; fs resolution; in situ; local field models; local-field effects; ms range; multichannel scaler; optically excited; pulse delay; pulsed tripled Nd:YAG laser; radiative decay rates; radiative lifetime; reference pulse; refractive-index change; refractivity; spontaneous emission; supercritical CO/sub 2/; time-resolved interferometric technique; transmitted pulse; varying refractive index; Delay; Gas lasers; Optical interferometry; Optical pulses; Optical recording; Optical refraction; Optical variables control; Refractive index; Spectroscopy; Spontaneous emission;
Conference_Titel :
Quantum Electronics Conference, 1998. IQEC 98. Technical Digest. Summaries of papers presented at the International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-541-2
DOI :
10.1109/IQEC.1998.680005