SEALER: Novel Monte-Carlo Simulator for Single Event Effects of Composite-Materials Semiconductor Devices

A Monte-Carlo simulation code SEALER was developed for neutron-induced single event upset of semiconductor devices at the ground level, in which composite material effects are fully simulated. Any size and structures of 8 composite material such as Si, SiO₂, Si₃N₄, Ta₂O₅, WSi₂, Cu, Al, TiN can be included for analyses of nuclear spallation reactions and charge collection mechanisms. Some preliminary implications of composite material effects are demonstrated including an apparent contribution of elastic scattering to single event upset in lower energy region as low as 2 MeV or even lower.