• DocumentCode
    1895399
  • Title

    A full-function COTS tester for B-2 avionics

  • Author

    Cadogan, Margaret D. ; Moorehead, J. Michael

  • Author_Institution
    Assembly Test Div., Teradyne Inc., Boston, MA, USA
  • fYear
    1997
  • fDate
    22-25 Sep 1997
  • Firstpage
    218
  • Lastpage
    223
  • Abstract
    This paper describes the integration efforts by Teradyne and Hewlett-Packard to produce the Radio Frequency Analog Digital (RFAD) tester for the B-2 Depot at Tinker AFB. The objective was to combine commercial-off-the-shelf (COTS) components while meeting the depot´s system-level performance requirements. This paper discusses aspects of the integration effort, including hardware integration and test, software integration, and verification of system specifications. Hardware topics include the use of a matrix switching configuration to provide hybrid digital/analog pins and an RF interface switch matrix to ensure signal integrity at the RF system interface. Software topics include the integration of Teradyne´s ProgramGuide software with Hewlett-Packard´s Visual Engineering Environment (HP VEE) to provide a single, integrated test executive environment. The paper also discusses the self-test and normalization techniques used to ensure signal specifications are met at the RFAD´s interfaces. The conclusion summarizes the challenges of integrating COTS test hardware and software on the scale required by the B-2 Depot, and describes technology that can be applied to a wide range of avionics applications
  • Keywords
    automatic test equipment; automatic test software; avionics; computer interfaces; electronic equipment testing; integrated software; military avionics; peripheral interfaces; visual programming; B-2 Depot; B-2 avionics; COTS test hardware; COTS test software; Hewlett-Packard; Hewlett-Packard´s Visual Engineering Environment; RF interface switch matrix; Radio Frequency Analog Digital tester; Teradyne; Tinker AFB; commercial-off-the-shelf components; hardware integration; hybrid digital/analog pins; integrated test executive environment; integration; matrix switching; normalization; self-test; software integration; Aerospace electronics; Application software; Built-in self-test; Hardware; Pins; RF signals; Radio frequency; Software testing; Switches; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-4162-7
  • Type

    conf

  • DOI
    10.1109/AUTEST.1997.633615
  • Filename
    633615