Analysis of Total-Dose Response of A Bipolar Voltage Comparator Combining Radiation Experiments And Design Data

Author

Bernard, M.F. ; Boch, J. ; Vaillé, J.R. ; Saigne, F. ; Schrimpf, R.D. ; Lorfévre, E. ; David, J.P. ; Dusseau, L.

Author_Institution

Univ. Montpellier II, Montpellier

fYear

2005

fDate

19-23 Sept. 2005

Abstract

A circuit analysis of the LM139 voltage comparator is presented to clarify the roles played by each part of this micro-circuit in determining the total dose-induced degradation. This method, based on both theoretical and experimental data, reveals the input and output stages to be the main portions of the circuit responsible for the device failure.

Keywords

bipolar analogue integrated circuits; comparators (circuits); radiation effects; LM139 voltage comparator; bipolar voltage comparator; circuit analysis; device failure; integrated circuits; linear voltage comparator; radiation experiments; total dose-induced degradation; total-dose response; Analog circuits; Analog integrated circuits; Bipolar transistors; Circuit analysis; Degradation; Failure analysis; Feedback loop; Low voltage; Radiation effects; Signal analysis; Bipolar analog circuits; Integrated Circuits (ICs); circuitry; linear voltage comparator; total dose;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on

Conference_Location

Cap d´Agde

ISSN

0379-6566

Print_ISBN

978-0-7803-9502-2

Electronic_ISBN

0379-6566

Type

conf

DOI

10.1109/RADECS.2005.4365597

Filename

4365597