DocumentCode
1895548
Title
A SOS MOSFET SPICE model for confident analogue circuit design
Author
Howes, R. ; Redman-White, W. ; Nichols, K.G. ; Robinson, M. ; Kerr, J. ; Mole, P.J.
Author_Institution
Dept. of Electron., Southampton Univ., UK
fYear
1991
fDate
1-3 Oct 1991
Firstpage
90
Lastpage
91
Abstract
The authors present details of a charge-based circuit simulation model which is continuous from subthreshold to strong inversion and is therefore suitable for analog design. The model has been implemented in the SPICE2 program. The model equivalent circuit is shown, and a set of simulated subthreshold characteristics for an n-channel device is presented. The current is smooth and continuous from cutoff through subthreshold to strong inversion, and the influence of the kink effect can be seen in increasing the inverse subthreshold slope with increasing drain bias. Sample capacitance characteristics are illustrated, and these are also smooth and continuous into subthreshold, allowing accurate small-signal simulation and enhancing convergence in transient simulation. Good modeling of the drain conductance is achieved throughout the kink region, ensuring correct prediction of circuit small-signal gain. In the frequency domain, the model predicts the correct behavior of drain admittance, which is particularly important in analog design. The typical measured threshold shift dependence on total radiation dose is also illustrated
Keywords
circuit analysis computing; electronic engineering computing; equivalent circuits; frequency-domain analysis; insulated gate field effect transistors; linear integrated circuits; semiconductor device models; transient response; SOS MOSFET; SPICE model; SPICE2 program; Si-Al2O3; analogue circuit design; capacitance characteristics; charge-based circuit; circuit small-signal gain; convergence; drain admittance; drain conductance; frequency domain; inverse subthreshold slope; kink effect; model equivalent circuit; n-channel device; simulated subthreshold characteristics; simulation model; small-signal simulation; threshold shift dependence; total radiation dose; transient simulation; Admittance; Capacitance-voltage characteristics; Circuit simulation; Circuit synthesis; Convergence; Equivalent circuits; Frequency domain analysis; MOSFET circuits; Predictive models; SPICE;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, 1991. Proceedings, 1991., IEEE International
Conference_Location
Vail Valley, CO
Print_ISBN
0-7803-0184-6
Type
conf
DOI
10.1109/SOI.1991.162871
Filename
162871
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