Title :
Total Dose and Single Event Transients in Linear Voltage Regulators
Author :
Kelly, A.T. ; Adell, P.C. ; Witulski, A.F. ; Holman, W.T. ; Schrimpf, R.D. ; Pouget, Vincent
Author_Institution :
Vanderbilt Univ., Nashville
Abstract :
Radiation effects on four common DC linear regulator topologies are investigated. Increasing total dose is shown to degrade converter regulation by degrading converter loop gain and phase response. SET response is characterized, and a mitigation technique is proposed. Shunt regulator topologies are found to be superior to series regulator topologies in terms of radiation tolerance.
Keywords :
radiation effects; voltage regulators; DC linear regulator topologies; converter loop gain; linear voltage regulators; mitigation technique; phase response; radiation tolerance; series regulator topologies; shunt regulator topologies; single event transients; Circuit topology; Degradation; Driver circuits; Feedback circuits; Operational amplifiers; Regulators; Resistors; Sampling methods; Transient response; Voltage;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Conference_Location :
Cap d´Agde
Print_ISBN :
978-0-7803-9502-2
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2005.4365600
