Title :
New Details about the Frequency Behaviour of Irradiated Bipolar Op Amps
Author :
Franco, F.J. ; Zong, Y. ; Agapito, J.A.
Author_Institution :
Univ. Complutense de Madrid, Madrid
Abstract :
The frequency behaviour of irradiated bipolar op amps is always expected to worsen when the device is irradiated. In other words, parameters like the slew rate and the gain-bandwidth product are to decrease after either neutron or gamma tests. However, some neutron and TID tests performed on a large variety of bipolar op amps have shown that the evolution of the frequency behaviour is not as simple as it is usually believed. In fact, there is evidence of an increasing influence of the power supply values on the values of the former parameters, which can be extremely important in some devices. Also, the relationship among different frequency parameters has been investigated and, finally, an interesting and unknown phenomenon is finally depicted. This phenomenon is the appearance of spontaneous oscillations in fed-back op amps, without doubt related to a modification of the gain and phase margins of the devices.
Keywords :
gamma-ray effects; neutron effects; operational amplifiers; fed-back op amps; gain-bandwidth; gamma tests; irradiated bipolar op amps; neutron tests; power supply; slew rate; spontaneous oscillations; Frequency; Gamma rays; Inductors; Large Hadron Collider; Neutrons; Operational amplifiers; Performance evaluation; Power supplies; Testing; Voltage; Bipolar technology; gain-bandwidth product; neutron irradiation; op amps; slew rate;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Conference_Location :
Cap d´Agde
Print_ISBN :
978-0-7803-9502-2
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2005.4365601