DocumentCode
1895733
Title
Uncertainty propagation in criticality measures for driver assistance
Author
Stellet, Jan Erik ; Schumacher, Jan ; Branz, Wolfgang ; Zollner, J. Marius
Author_Institution
Corp. Res., Vehicle Safety & Assistance Syst., Robert Bosch GmbH, Renningen, Germany
fYear
2015
fDate
June 28 2015-July 1 2015
Firstpage
1187
Lastpage
1194
Abstract
Active safety systems employ surround environment perception in order to detect critical driving situations. Assessing the threat level, e.g. the risk of an imminent collision, is usually based on criticality measures which are calculated from the sensor measurements. However, these metrics are subject to uncertainty. Probabilistic modelling of the uncertainty allows for more informed decision making and the derivation of sensor requirements. This work derives closed-form expressions for probability distributions of criticality measures under both state estimation and prediction uncertainty. The analysis is founded on uncertainty propagation in non-linear motion models. Finding the distribution of model-based criticality metrics is then performed using closed-form expressions for the collision probability and error propagation in implicit functions. All results are illustrated and verified in Monte-Carlo simulations.
Keywords
Monte Carlo methods; automobiles; collision avoidance; decision making; error statistics; intelligent transportation systems; motion control; nonlinear control systems; road safety; statistical distributions; uncertain systems; Monte-Carlo simulation; active safety system; automotive collision avoidance system; closed-form expression; collision probability; criticality measure; decision making; driver assistance system; error propagation; model-based criticality metrics; nonlinear motion model; probability distribution; sensor measurement; uncertainty propagation; Acceleration; Measurement uncertainty; Noise; Predictive models; Uncertainty; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Vehicles Symposium (IV), 2015 IEEE
Conference_Location
Seoul
Type
conf
DOI
10.1109/IVS.2015.7225844
Filename
7225844
Link To Document