DocumentCode :
1896013
Title :
Thin film monitoring with silicon bulk acoustic resonators
Author :
Lee, Joshua E -Y ; Bahreyni, Behraad ; Seshia, Ashwin A.
Author_Institution :
Dept. of Eng., Univ. of Cambridge, Cambridge
fYear :
2008
fDate :
26-29 Oct. 2008
Firstpage :
581
Lastpage :
584
Abstract :
This paper reports a single-crystal silicon mass sensor based on a square-plate resonant structure excited in the wine glass bulk acoustic mode at a resonant frequency of 2.065 MHz and an impressive quality factor of 4 million at 12 mtorr pressure. Mass loading on the resonator results in a linear downshift in the resonant frequency of this device, wherein the measured sensitivity is found to be 175 Hz cm2/mug. The silicon resonator is embedded in an oscillator feedback loop, which has a short-term frequency stability of 3 mHz (approximately 1.5 ppb) at an operating pressure of 3.2 mtorr, corresponding to an equivalent mass noise floor of 17 pg/cm2. Possible applications of this device include thin film monitoring and gas sensing, with the potential added benefits of scalability and integration with CMOS technology.
Keywords :
CMOS integrated circuits; bulk acoustic wave devices; gas sensors; oscillators; silicon; thin film sensors; gas sensing; oscillator feedback loop; silicon bulk acoustic resonators; silicon resonator; single-crystal silicon mass sensor; square-plate resonant structure; thin film monitoring; wine glass bulk acoustic mode; Acoustic devices; Acoustic sensors; CMOS technology; Glass; Monitoring; Q factor; Resonance; Resonant frequency; Semiconductor thin films; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2008 IEEE
Conference_Location :
Lecce
ISSN :
1930-0395
Print_ISBN :
978-1-4244-2580-8
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2008.4716506
Filename :
4716506
Link To Document :
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