• DocumentCode
    1896159
  • Title

    Measurement of the Base Resistance at Active Region of Polyemitter Bjt by Noise Method

  • Author

    Tsun-Lai Hsu ; Chen, H.H. ; Jeng Gong ; Yu, K.Y. ; Chen, L.J.

  • Author_Institution
    Department of Electrical Engineering, National Tsing Hua University,Taiwan R.O.C
  • fYear
    1993
  • fDate
    6-7 March 1993
  • Firstpage
    35
  • Lastpage
    37
  • Keywords
    Active noise reduction; Circuit noise; Contact resistance; Electric resistance; Electrical resistance measurement; Fluctuations; Noise measurement; Semiconductor device noise; Thermal resistance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Modeling & Simulation, 1993. SMS Technical Digest. 1993 Symposium on
  • Conference_Location
    Taipei, Taiwan
  • Print_ISBN
    0-7803-1225-2
  • Type

    conf

  • DOI
    10.1109/SMS.1993.664541
  • Filename
    664541
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1896159