DocumentCode :
1896159
Title :
Measurement of the Base Resistance at Active Region of Polyemitter Bjt by Noise Method
Author :
Tsun-Lai Hsu ; Chen, H.H. ; Jeng Gong ; Yu, K.Y. ; Chen, L.J.
Author_Institution :
Department of Electrical Engineering, National Tsing Hua University,Taiwan R.O.C
fYear :
1993
fDate :
6-7 March 1993
Firstpage :
35
Lastpage :
37
Keywords :
Active noise reduction; Circuit noise; Contact resistance; Electric resistance; Electrical resistance measurement; Fluctuations; Noise measurement; Semiconductor device noise; Thermal resistance; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Modeling & Simulation, 1993. SMS Technical Digest. 1993 Symposium on
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7803-1225-2
Type :
conf
DOI :
10.1109/SMS.1993.664541
Filename :
664541
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1896159
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