DocumentCode
1896161
Title
Antenna-coupled uncooled THz microbolometer based on micromachined GaAs and LSMO thin film
Author
Lobotka, P. ; Lalinsky, T. ; Spankova, M. ; Vavra, I. ; Chromik, S. ; Hascik, S. ; Smatko, V. ; Mozolova, Z. ; Kovacova, E. ; Derer, J. ; Gazi, S. ; Gierlowski, P.
Author_Institution
Inst. of Electr. Eng., Bratislava
fYear
2008
fDate
26-29 Oct. 2008
Firstpage
604
Lastpage
607
Abstract
We report on preliminary results on antenna-coupled microbolometer designed for frequency range 1.4-11.3 THz. Thin film of a composition of La0.67Sr0.33MnO3 (LSMO) was selected as a proper material, since it provides high TCR values due to its phase transition. The microbolometer consists of LSMO disk (~8 mum in diameter) placed in a feed point of gold thin-film log-periodic antenna. These main parts are fabricated on 2 mum thick suspended GaAs island thermally isolated from the rest of the micromachined GaAs substrate by four microbridges. MgO buffer layer was used to ensure epitaxial growth of LSMO film on GaAs substrate. Though our LSMO films deposited by magnetron sputtering on single-crystalline MgO substrates show TCR = 0.03 K-1 at 300 K [11], the epitaxial films sputtered on MgO-buffered GaAs substrates have peculiar temperature dependence of the optical response (OR). The shape of OR(T) differs from that of differentiated R(T), which implies that the OR is not of pure bolometric origin. At the same time, thorough structural analyses reveal high-quality epitaxial growth of both the layers - MgO buffer and LSMO. Therefore, the switch to pulsed laser deposition technique is necessary in order to achieve the goal - fabrication of THz detector working at room temperature.
Keywords
III-V semiconductors; bolometers; epitaxial growth; gallium arsenide; micromachining; pulsed laser deposition; sputtering; GaAs; antenna-coupled uncooled THz microbolometer; buffer layer; epitaxial growth; magnetron sputtering; micromachined thin film; optical response; pulsed laser deposition technique; Epitaxial growth; Frequency; Gallium arsenide; Optical buffering; Optical films; Pulsed laser deposition; Sputtering; Strontium; Substrates; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2008 IEEE
Conference_Location
Lecce
ISSN
1930-0395
Print_ISBN
978-1-4244-2580-8
Electronic_ISBN
1930-0395
Type
conf
DOI
10.1109/ICSENS.2008.4716512
Filename
4716512
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