Title :
RADFET Response to Proton Irradiation Under Different Biasing Configurations
Author :
Jaksic, A. ; Kimoto, Y. ; Mohammadzadeh, A. ; Hajdas, W.
Author_Institution :
Tyndall Nat. Inst., Cork
Abstract :
Response of RADFETs manufactured at Tyndall National Institute to protons with energies of up to 60 MeV has been studied. RADFET response is compared for different biasing configurations and the effect of package lids is investigated.
Keywords :
MOSFET; proton effects; RADFET; electron volt energy 60 MeV; package lids; proton irradiation; Aerospace industry; Ceramics; Electronics packaging; Electrons; Geometry; MOSFETs; Manufacturing; Monitoring; Protons; Threshold voltage; Dosimetry; RADFETs; proton response;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Conference_Location :
Cap d´Agde
Print_ISBN :
978-0-7803-9502-2
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2005.4365626
