Title :
Radiation tolerant commercial of the shelf components for the remote readout of RADFETs and PIN diodes
Author :
Pignard, C. ; Wijnands, T.
Author_Institution :
CERN, Geneva
Abstract :
The radiation tolerance of a complete set of components required for the remote readout of RADFETs and PIN diodes has been investigated. A radiation tolerant, temperature stabilized design for reliable remote readout up to 200 Gy in a complex field is discussed.
Keywords :
field effect transistors; p-i-n diodes; radiation effects; PIN diodes; RADFETs; radiation tolerance; shelf components; Electric variables; Large Hadron Collider; MOSFET circuits; Manufacturing; Neutrons; Protocols; Proton accelerators; Space charge; Temperature sensors; Threshold voltage;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Conference_Location :
Cap d´Agde
Print_ISBN :
978-0-7803-9502-2
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2005.4365628
