• DocumentCode
    1896249
  • Title

    Optimization of Well-Type Guard Rings in Epi Cmos

  • Author

    Chih-Yao Huang ; Ming-Jer Chen

  • Author_Institution
    Institute of Electronics, National Chiao-Tung University, Taiwan, R.O.C.
  • fYear
    1993
  • fDate
    6-7 March 1993
  • Firstpage
    43
  • Lastpage
    44
  • Keywords
    CMOS process; Circuit noise; Circuit simulation; Costs; Current measurement; Doping profiles; Epitaxial layers; Semiconductor device modeling; Semiconductor process modeling; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Modeling & Simulation, 1993. SMS Technical Digest. 1993 Symposium on
  • Conference_Location
    Taipei, Taiwan
  • Print_ISBN
    0-7803-1225-2
  • Type

    conf

  • DOI
    10.1109/SMS.1993.664546
  • Filename
    664546
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1896249