DocumentCode :
1896249
Title :
Optimization of Well-Type Guard Rings in Epi Cmos
Author :
Chih-Yao Huang ; Ming-Jer Chen
Author_Institution :
Institute of Electronics, National Chiao-Tung University, Taiwan, R.O.C.
fYear :
1993
fDate :
6-7 March 1993
Firstpage :
43
Lastpage :
44
Keywords :
CMOS process; Circuit noise; Circuit simulation; Costs; Current measurement; Doping profiles; Epitaxial layers; Semiconductor device modeling; Semiconductor process modeling; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Modeling & Simulation, 1993. SMS Technical Digest. 1993 Symposium on
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7803-1225-2
Type :
conf
DOI :
10.1109/SMS.1993.664546
Filename :
664546
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1896249
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