Title :
Industrial experience with cycle error computation of cycle-accurate transaction level models
Author :
Junghee Lee ; Joonhwan Yi
Author_Institution :
Telecommunication R&D Center, Samsung Electronics, Suwon City, Gyeonggi-do, Korea
Abstract :
Transaction level modeling is gaining increasing popularity with the increasing design complexity of the system-on-a-chip. Transaction level models are frequently built from existing register transfer level models, which usually cause cycle errors. Measurable indicators of cycle errors are necessary, and their definitions are important. This paper presents the challenges in cycle error computation and our proposed method, although its effectiveness has not been proved formally. The main contribution of our study is to report an industrial experience with cycle error computation.
Keywords :
Communication industry; Computational modeling; Computer industry; Delay; Energy consumption; Power measurement; Software measurement; System-on-a-chip; Time measurement; Yield estimation;
Conference_Titel :
SOC Conference, 2007 IEEE International
Conference_Location :
Hsin Chu, Taiwan
Print_ISBN :
978-1-4244-1592-2
Electronic_ISBN :
978-1-4244-1593-9
DOI :
10.1109/SOCC.2007.4545448