A X-Ray CMOS Image Sensor Based on Current Mirroring Integration Readout Circuit

Author

Zhang, Wenpu ; Pan, Yinsong ; Meng, Liya

Author_Institution

Chongqing Key Lab. of Emergency Commun., Chongqing Commun. Inst., Chongqing, China

Volume

1

fYear

2012

fDate

23-25 March 2012

Firstpage

592

Lastpage

595

Abstract

An X-ray CMOS Image Sensor (CMI-X-IS) based on a current mirroring integration (CMI) readout circuit (ROIC) was developed. The photocurrent was mirrored and magnified in an integration capacitor out of the pixel. Its noise was suppressed by correlated double sampling circuit, and the video signal was exported by CMOS shift register and multiplexer and output stages. The quantitative analysis for CMI circuit design was implemented emphatically, and computer simulation of CMI was fulfilled. The 64 pixel-line-array image sensor was fabricated by 2μm CMOS process, and the performance parameters of CMI-X-IS were measured. The measurement results show that CMI-X-IS has the characteristics of acceptable non-uniformity, lower dark noise voltage, larger unit area responsivity, higher output voltage and wider dynamic range. Applying this CMI-X-IS to an experiment system, the video signal waveform of target with different density and different size is obtained.

Keywords

CMOS image sensors; X-ray apparatus; capacitors; integrated circuit design; readout electronics; shift registers; CMI ROIC; CMI circuit design; CMI-X-IS; CMOS multiplexer; CMOS shift register; X-ray CMOS image sensor; computer simulation; current mirroring integration readout circuit; double sampling circuit; integration capacitor; photocurrent; pixel-line-array image sensor; quantitative analysis; size 2 mum; video signal waveform; Arrays; CMOS image sensors; CMOS integrated circuits; Dynamic range; Noise; X-ray imaging; computer simulation; correlated double sampling circuit; current mirroring integration readout circuit; performance parameters measurement; video signal waveform;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Science and Electronics Engineering (ICCSEE), 2012 International Conference on

Conference_Location

Hangzhou

Print_ISBN

978-1-4673-0689-8

Type

conf

DOI

10.1109/ICCSEE.2012.457

Filename

6187916