DocumentCode :
1896402
Title :
GaAs multichip module for a parallel processing system
Author :
Miyagi, Takeshi ; Itoh, Kenji ; Kimijima, Susumu ; Sudo, Toshio
Author_Institution :
Toshiba Corp., Kawasaki, Japan
fYear :
1990
fDate :
20-23 May 1990
Firstpage :
580
Abstract :
A high-speed data transfer network for a parallel processing system has been developed on the basis of multichip packaging technology. The high-speed data transfer network connecting multiple processor units (PUs) has been achieved in a module using 8 bit-slice GaAs bus logic (BL) LSIs operating at 100 MHz. The GaAs multichip module consists of 12 GaAs BL LSIs in a 3×4 matrix. Each GaAs chip is sealed in a chip carrier with bumps. The chip carrier is flip-chip bonded to the copper/polyimide thin-film multilayer substrate. The characteristic impedance of the signal lines on the module is controlled to 75 Ω to be compatible with the GaAs original interface level. The thin-film termination resistors are made of Ni/Cr in the substrate to prevent reflections. A total power dissipation of 90 W of the module was efficiently radiated by a newly developed heat-pipe cooling module at 2-m/s air flow velocity with low acoustical noise. the total thermal resistance from the chip to the ambient medium was approximately 3°C/W. A 3-Gb/s data transfer rate (32 b×100 MHz) can be realized by four stacked modules of 48 GaAs BLs
Keywords :
III-V semiconductors; cooling; flip-chip devices; large scale integration; modules; packaging; 100 MHz; 90 W; GaAs; LSIs; acoustical noise; bus logic; characteristic impedance; copper/polyimide thin-film multilayer substrate; data transfer rate; flip-chip bonded; heat-pipe cooling module; high-speed data transfer network; multichip module; multichip packaging technology; multiple processor units; parallel processing system; signal lines; stacked modules; thin-film termination resistors; total power dissipation; total thermal resistance; Bonding; Gallium arsenide; Joining processes; Logic; Multichip modules; Packaging; Parallel processing; Substrates; Thermal resistance; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location :
Las Vegas, NV
Type :
conf
DOI :
10.1109/ECTC.1990.122246
Filename :
122246
Link To Document :
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