• DocumentCode
    1896411
  • Title

    Improving Reliability of SRAM-Based FPGAs by Inserting Redundant Routing

  • Author

    Filho, Caio Kinzel ; Kastensmidt, Fernanda Lima ; Carro, Luigi

  • fYear
    2005
  • fDate
    19-23 Sept. 2005
  • Abstract
    This work proposes a new fault-tolerant method able to deal with open and shortcut circuit faults in SRAM-based FPGA routing connections. The bitflips provoked by upsets in the routing control memory cells are the major concern in SRAM-based FPGAs, since these memory cells represent the majority of the bits in the configuration bitstream. Even in an application hardened by triple modular redundancy (TMR), upsets in the routing bits still represent a major problem, due to the possibilities of short and open circuits that can happen in more than one redundant block of the TMR The idea presented in this paper is to create local redundancy in the routing, so that whenever the critical connection fails, the redundant one ensures a working connection by propagating the correct value. The proposed method is based on duplication of the internal critical connections. A detailed classification and test of each case solution is explained in this paper. Preliminary results show the efficiency of this method to reduce error due routing upsets.
  • Keywords
    SRAM chips; fault tolerance; field programmable gate arrays; integrated circuit reliability; SRAM-based FPGA routing connections; bitflips; fault-tolerant method; field programmable gate arrays; memory cells; redundant routing; reliability; shortcut circuit faults; triple modular redundancy; Circuit faults; Fault tolerance; Field programmable gate arrays; Logic; Random access memory; Redundancy; Routing; Single event upset; Table lookup; Testing; fault tolerance; field programmable gate arrays; routing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
  • Conference_Location
    Cap d´Agde
  • ISSN
    0379-6566
  • Print_ISBN
    978-0-7803-9502-2
  • Electronic_ISBN
    0379-6566
  • Type

    conf

  • DOI
    10.1109/RADECS.2005.4365640
  • Filename
    4365640