DocumentCode :
1896496
Title :
Experimentally validated circuit-simulation model of thyristor-type devices based on semiconductor physics
Author :
Schroder, Stefan ; Detjen, Dirk ; Kollensperger, Peter ; De Doncker, Rik W.
Author_Institution :
Inst. for Power Electron. & Electr. Drives, RWTH Aachen Univ., Germany
Volume :
1
fYear :
2004
fDate :
20-25 June 2004
Firstpage :
611
Abstract :
Accurate circuit-simulations of power-electronic circuits need precise device models. Unfortunately, all commercially available circuit simulation programs lack suitable models of high-power thyristor-type, i.e. GTO, GCT or MTO, devices. In this paper, a circuit-simulation model of thyristor-type devices is presented and evaluated. The model is based on semiconductor physics and allows transient thermal simulations. The simulation results are compared to measurements on a high-power test-bench showing excellent agreement. When the operating conditions, i.e. load current, DC-bus voltage and device temperature, are varied, excellent agreement remains between measurements and simulations. This proofs the large range of validity of these new models.
Keywords :
benchmark testing; circuit simulation; thyristors; GCT devices; GTO devices; MTO devices; circuit-simulation model; high-power test-bench; high-power thyristors; power-electronic circuits; semiconductor physics; thyristor-type devices; transient thermal simulations; Charge carrier processes; Circuit simulation; Circuit testing; Equations; Physics; Power electronics; Space charge; Temperature; Thyristors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Specialists Conference, 2004. PESC 04. 2004 IEEE 35th Annual
ISSN :
0275-9306
Print_ISBN :
0-7803-8399-0
Type :
conf
DOI :
10.1109/PESC.2004.1355817
Filename :
1355817
Link To Document :
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