Title :
SEU Sensitivity of an Advanced 0.13μm SOI Microprocessor
Author :
Haddad, Nadim ; Hatfield, Craig ; McPeak, Richard ; Shaffer, Scoff ; Shoga, Munir
Author_Institution :
BAE Syst., Manassas
Abstract :
An advanced 0.13 μm SOI Microprocessor was tested for its sensitivity to heavy ions and protons, and compared with a previous generation 0.18 μm version tested with the same methodology. Even though the overall error rates were somewhat comparable, the 0.13 μm version experienced a significantly higher frequency of processor functional error lock-up (hang).
Keywords :
errors; microprocessor chips; silicon-on-insulator; SOI microprocessor; error rates; heavy ions; processor functional error lock-up; protons; single event upset; size 0.13 micron; CMOS technology; Cyclotrons; Error analysis; Frequency; Microprocessors; Performance evaluation; Protons; Radiation effects; Single event upset; Testing; Single event upset (SEU); error rates; microprocessor; radiation effects; silicon-on-insulator (SOI);
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Conference_Location :
Cap d´Agde
Print_ISBN :
978-0-7803-9501-5
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2005.4365648
