DocumentCode :
1896595
Title :
Thermal analysis of power MOSFETs using Rebeca-3D thermal modeling software (from Epsilon Ingenierie) versus physical measurements and possible extractions
Author :
Pandya, Kaushal
Author_Institution :
Vishay Siliconix, Santa Clara, CA, USA
fYear :
2005
fDate :
18-20 April 2005
Firstpage :
394
Lastpage :
397
Abstract :
Shrinking semiconductor packages, increasing die densities, process changes, and the requirements for optimizing electro-mechanical assemblies are making sound thermal designs more important than ever. Depending on the application scenario, thermal considerations can be approached from two angles. Rebeca-3D, a semi-FEA based software tool, provides the ability to develop a thermal model using detailed device geometry and material characteristics. The tool´s versatility allows it to be used to analyze a design in a range of application scenarios. Using this platform, this paper discusses actual examples of thermal model development and results. The results are first validated by comparing with datasheet information and experiments in an application lab. Following simulation, the platform is used to extrapolate the measurements done in the application lab. The results enable development of thermal performance profiles for different packages and for different electrical and assembly conditions. Several examples are discussed with figures and pictures. The study compares the results of simulations and tests on actual devices.
Keywords :
electronic engineering computing; finite element analysis; power MOSFET; semiconductor device measurement; semiconductor device models; semiconductor device packaging; software tools; thermal analysis; Rebeca-3D thermal modeling; electronic engineering computing; finite element analysis; power MOSFET; semi-FEA based software tool; semiconductor device measurement; semiconductor device models; semiconductor device packaging; semiconductor packages; thermal analysis; thermal model development; thermal performance profile; Application software; Assembly; Design optimization; Geometry; MOSFETs; Power measurement; Semiconductor device packaging; Software measurement; Software tools; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005. EuroSimE 2005. Proceedings of the 6th International Conference on
Print_ISBN :
0-7803-9062-8
Type :
conf
DOI :
10.1109/ESIME.2005.1502836
Filename :
1502836
Link To Document :
بازگشت