DocumentCode
1896847
Title
A possible phase transition in metallic polythiophene, and poly(3-methylthiophene) at low temperature
Author
Masubuchi, S. ; Kazama, Satoshi
Author_Institution
Chuo University
fYear
1994
fDate
24-29 July 1994
Firstpage
338
Lastpage
338
Abstract
Summary form only given. Polythiophene (PT) and poly(3-methylthiophene) (PMeT) films prepared by electrochemical synthesis are flexible and highly conducting (/spl sigma/>100S/cm). We have studied the transport properties in as-grown PT and PMeT doped with PF/sub 6//sup -/. Precise measurements were made of the Voltage-Shorted-Compaction (VSC) resistivity (P/sub vsc/) and the absolute thermoelectric power S(T) between 1.6-300K, both of which are unique in abstracting the transport properties inherent to the crystallized regions of polymeric materials. In PT, (P/sub vsc/) exhibited a metallic behaviour at high temperatures between 30-100K with the temperature dependence approximately expressed by T/sup 2.5/, characteristic of the low dimensional electronic structure. Unlike the behaviour above 30K, (P/sub vsc/) increased steeply with decreasing temperature below 30K. Corresponding to (P/sub vsc/), S(T) also showed metallic behaviour at high temperatures, while at low temperatures an anomalous behaviour was observed as in TTF-TCNQ. The results were strongly indicative that a metal-insulator transition would occur in the crystallized regions at 30K. In PMeT, (P/sub vsc/) was metallic between 5-300K, with a T/sup 2/-dependence especially between 5-40K. Below 5K it became almost independent of temperature. The difference of the transport property of the bulk material of PT and PMeT is to be understood by their different transition temperatures.
Keywords
Conductive films; Conductivity; Crystalline materials; Crystallization; Metal-insulator structures; Physics; Power measurement; Temperature dependence; Thermoelectricity; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Science and Technology of Synthetic Metals, 1994. ICSM '94. International Conference on
Conference_Location
Seoul, Korea
Type
conf
DOI
10.1109/STSM.1994.835407
Filename
835407
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