• DocumentCode
    1896931
  • Title

    A Novel Technique for Modeling Radiation Effects in Solar Cells Utilizing SILVACO® Virtual Wafer Fabrication Software

  • Author

    Michael, Sherif

  • Author_Institution
    Naval Postgraduate Sch., Monterey
  • fYear
    2005
  • fDate
    19-23 Sept. 2005
  • Abstract
    A novel technique for modeling advanced solar cells using Silvacoreg virtual wafer fabrication software has been previously introduced. Over the past three years the new modeling approach has been extended to cover modeling of advanced multijunction cells, design and optimizations of these devices, as well as design of new quad-junction cells. In this paper, the ATLAS device simulator from Silvaco International has been demonstrated to have the potential for predicting the effects of electron radiation in solar cells by modeling material defects. A gallium arsenide solar cell was simulated in ATLAS and compared to an actual cell with radiation defects identified using deep level transient spectroscopy techniques. The cell data were compared for various fluence levels of 1 MeV electron radiation and the results have shown an average of only five percent difference between experimental and simulated cell output characteristics. These results demonstrate that ATLAS software can be a viable tool for predicting solar cell degradation due to electron radiation.
  • Keywords
    III-V semiconductors; deep level transient spectroscopy; electron beam effects; gallium arsenide; solar cells; ATLAS device simulator; GaAs; Silvaco virtual wafer fabrication software; cell output characteristics; deep level transient spectroscopy; electron radiation; gallium arsenide solar cell; muItijunction cells; quadjunction cells; solar cell degradation; Design optimization; Electrons; Fabrication; Gallium arsenide; Photovoltaic cells; Predictive models; Radiation effects; Semiconductor device modeling; Software tools; Spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
  • Conference_Location
    Cap d´Agde
  • ISSN
    0379-6566
  • Print_ISBN
    978-0-7803-9502-2
  • Electronic_ISBN
    0379-6566
  • Type

    conf

  • DOI
    10.1109/RADECS.2005.4365662
  • Filename
    4365662