DocumentCode :
189706
Title :
Quantized current conduction in memristors and its physical model
Author :
Yuying Zhang ; Islam Mou, Nurunnahar ; Pai, Pradeep ; Tabib-Azar, Massood
Author_Institution :
Electr. & Comput. Eng., Univ. of Utah, Salt Lake City, UT, USA
fYear :
2014
fDate :
2-5 Nov. 2014
Firstpage :
819
Lastpage :
822
Abstract :
We report, for the first time, quantized conductance as a function of time in Au-CuS-Cu memristors under sub-threshold voltages. Non-integer quantum steps were modeled using multi-branch growth of nanowires at sub-threshold voltages. As each branch or fractional branch forms, the device conductance increases by an integral or fractional step correspondingly. In gated devices, the gate voltage (both +/- polarities) turned off devices eliminating the need for bipolar drain-source voltages. The gated memristors showed 106 On/Off current ratios with 10 mV/decade slope. The nanowires were also imaged using contact-mode AFM that clearly showed wires protruding out-of the devices plane. A computational model using Matlab was developed to qualitatively model the quantized conductance and gate field effects. Since nanowires can be dissolved/formed (i.e., programmed) electronically, their presence at the surface can be used to program the sensing mechanisms in these devices.
Keywords :
copper compounds; electric admittance; gold compounds; memristors; nanowires; resistive RAM; semiconductor device models; AuCuSCu; computational model; contact-mode AFM; fractional step; integral step; memristors; multibranch nanowire growth; noninteger quantum steps; quantized conductance; quantized current conduction; subthreshold voltages; Anodes; Cathodes; Ions; Logic gates; Mathematical model; Memristors; Nanowires; gate field effects; memristors; modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SENSORS, 2014 IEEE
Conference_Location :
Valencia
Type :
conf
DOI :
10.1109/ICSENS.2014.6985125
Filename :
6985125
Link To Document :
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