Versatile 20 GHz wideband RF digitizer for test and measurement

Author

Adnani, Nikhil ; Lamanque, Mathieu ; Helaly, Tarek ; Farhan, Mohammad ; Hember, Tim ; Ward, Ian

Volume

17

Issue

4

fYear

2014

fDate

Aug. 2014

Firstpage

6

Lastpage

14

Abstract

Wireless device manufacturers are challenged with the test and measurement of ever-evolving complex signals while at the same time contending with shrinking test equipment budgets. For example, modern wireless signals can have bandwidths up to 80 MHz and can vary in operating frequency and amplitude over time. In contrast, affordable spectrum analyzers typically have narrow (up to 10 MHz) instantaneous bandwidth (IBW). This makes analyzing a time-varying wideband signal that is greater than 10 MHz in bandwidth with such narrowband instrumentation require a sweep over several frequency bands. This can yield erroneous measurement results.

Keywords

automatic test equipment; measurement errors; spectral analysers; ATE system; IBW; frequency 20 GHz; instantaneous bandwidth; measurement error; narrowband instrumentation; shrinking test equipment budget; signal analyser; spectrum analyzer; time-varying wideband signal; wideband RF digitizer; wireless device manufacturer; wireless signal; Bandwidth; Computer architecture; Dynamic range; Radio frequency; Receivers; Time-varying systems; Wideband;

fLanguage

English

Journal_Title

Instrumentation & Measurement Magazine, IEEE

Publisher

ieee

ISSN

1094-6969

Type

jour

DOI

10.1109/MIM.2014.6873723

Filename

6873723