DocumentCode :
1897442
Title :
High performance screen-printable silicone as selective hybrid IC encapsulant
Author :
Wong, C.P.
Author_Institution :
AT&T Bell Lab., Princeton, NJ, USA
fYear :
1990
fDate :
20-23 May 1990
Firstpage :
606
Abstract :
An excellent solvent-, flux-, and detergent-resistant screen-printable silicone (SPS) with a modest curing temperature and excellent adhesion to gold-plated substrate has been developed. The author describes the material formulation of and the need for an encapsulant with the above properties. Microdielectrometry was used to define the precise SPS cure schedule; temperature-humidity-bias was used to qualify the material´s electrical performance; Auger spectroscopy and laser ionization mass spectrometry were used to further elucidate the crosslinking density and the interfacial interaction of the SPS and the encapsulated substrate. The high crosslinking density resulting from the addition of an aminosilane and high filler (fused silica) loading were shown to be the keys to a solvent-resistant silicon formulation
Keywords :
Auger effect; encapsulation; hybrid integrated circuits; mass spectrometer applications; silicones; Auger spectroscopy; adhesion; aminosilane; crosslinking density; cure schedule; curing temperature; electrical performance; filler; interfacial interaction; laser ionization mass spectrometry; material formulation; microdielectrometry; screen-printable silicone; selective hybrid IC encapsulant; temperature-humidity-bias; Adhesives; Electric resistance; Encapsulation; Hybrid integrated circuits; Mass spectroscopy; Optical materials; Protection; Purification; Solvents; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location :
Las Vegas, NV
Type :
conf
DOI :
10.1109/ECTC.1990.122250
Filename :
122250
Link To Document :
بازگشت