DocumentCode
1897444
Title
Analytical solutions for two-dimensional heat spread in ASICs using conformal mapping techniques
Author
Augustin, Adam ; Kostka, Arno ; Maj, Bartosz
Author_Institution
Solid State Electron. Lab., Tech. Univ. of Darmstadt, Germany
fYear
2005
fDate
18-20 April 2005
Firstpage
590
Lastpage
596
Abstract
The subject of this work is the calculation of the temperature distribution in ASICs, generated by rectangular sources at the top surface of the ASIC while the backside of the substrate is held at a fixed temperature. Using conformal mapping, the steady state temperature distribution generated by surface sources of variable width in ASICs of variable thickness is calculated. Conformal mapping theory, especially the Schwarz-Christoffel transformation, is used to transform the given structure into simpler topology so that the solution of the heat equation becomes much easier and allows the use of given solutions, e.g. for symmetrical structures. Additionally, methods are shown on how to obtain transformations that can be inverted analytically, so that all results appear in closed-form elementary functions containing the geometry parameters. Furthermore, some hints are given, how a multitude of thermal problems can be solved using the conformal mapping method. Finally, the results are compared with ANSYS simulations for the verification of the two approaches.
Keywords
application specific integrated circuits; conformal mapping; differential equations; equations of state; heat transfer; network analysis; reliability; temperature distribution; thermal management (packaging); 2D heat spread; ANSYS simulations; ASIC; Schwarz-Christoffel transformation; conformal mapping; heat equation; temperature distribution; Amplitude shift keying; Application specific integrated circuits; Conformal mapping; Control systems; Geometry; Heat sinks; Laplace equations; Silicon; Solid state circuits; Temperature distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005. EuroSimE 2005. Proceedings of the 6th International Conference on
Print_ISBN
0-7803-9062-8
Type
conf
DOI
10.1109/ESIME.2005.1502872
Filename
1502872
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