DocumentCode :
1897696
Title :
A constitutive single crystal model for the silicon mechanical behavior: applications to the stress induced by silicided lines and STI in MOS technologies
Author :
Cacho, F. ; Orain, S. ; Cailletaud, G. ; Jaouen, H.
fYear :
2005
fDate :
18-20 April 2005
Firstpage :
635
Lastpage :
640
Abstract :
The control of stress in silicon devices is an important issue for improvement MOS transistor performance. Some high temperature processes, like active zone silicidation or shallow trench isolation (Steegen, et al., 2001, Huff, et al., 2002) can induce motions of dislocation just by cooling the crystal down to room temperature. In this study, a single crystal model for the silicon mechanical behavior is implemented by finite element simulation using ZeBuLon®. The constitutive equations are taken from the well known model of Alexander and Haasen (Alexander, et al., 1968) applied to each slip along the {111} planes in the <110> directions. The effect of silicide-induced stress is studied and the formation of defects in silicon during the cooling is discussed. Then, two layouts where the STI pattern is different are simulated and the results are checked against the leakage current measured.
Keywords :
MOSFET; crystal defects; elemental semiconductors; finite element analysis; isolation technology; reliability; semiconductor junctions; semiconductor thin films; silicon; thermal management (packaging); MOS technology; MOS transistor improvement; STI; active zone silicidation; constitutive single crystal model; finite element simulation; mechanical behavior; shallow trench isolation; silicided lines; stress control; Cooling; Equations; Finite element methods; Isolation technology; MOSFETs; Semiconductor device modeling; Silicidation; Silicon devices; Stress control; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005. EuroSimE 2005. Proceedings of the 6th International Conference on
Print_ISBN :
0-7803-9062-8
Type :
conf
DOI :
10.1109/ESIME.2005.1502880
Filename :
1502880
Link To Document :
بازگشت