DocumentCode
1897717
Title
A multi scale finite element methodology to evaluate wire bond pad architectures
Author
Fiori, V. ; Orain, S.
Author_Institution
STMicroelectronics, Crolles Cedex, France
fYear
2005
fDate
18-20 April 2005
Firstpage
648
Lastpage
655
Abstract
This work focuses on a multi scale finite element method (FEM) in order to model the wire bonding process. The methodology and results aiming at understanding and predicting the bond pad failures are detailed. Due to the very detrimental aspect ratios involve in the wire bonding process modeling, the use of a multilevel technique is mandatory. However, results highlight that precautions are needed at the macro scale when choosing the representative unit cell (RUC) during the homogenization step. More precisely, a simple law of mixture leads to a wrong evaluation of the displacements at the global scale and impacts strongly the local stress field. The FE method is applied in a linear three dimensional analysis. Both thermal and force loadings are tested and their contributions are discussed on several wire bond pad layouts.
Keywords
failure analysis; finite element analysis; lead bonding; FE method; FEM; RUC; force loading; linear 3D analysis; multi scale finite element method; multilevel technique; representative unit cell; thermal loading; wire bond pad architecture; wire bonding process; Atherosclerosis; Bonding forces; Bonding processes; Compressive stress; Finite element methods; Tensile stress; Thermal force; Thermal loading; Thermal stresses; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005. EuroSimE 2005. Proceedings of the 6th International Conference on
Print_ISBN
0-7803-9062-8
Type
conf
DOI
10.1109/ESIME.2005.1502882
Filename
1502882
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