• DocumentCode
    1898058
  • Title

    Special properties of molding compound for surface mounting devices

  • Author

    Nishioka, T. ; Nagasaqa, M. ; Igarashi, K. ; Kohmoto, M. ; Ito, S.

  • Author_Institution
    Nitto Denko Corp., Mie, Japan
  • fYear
    1990
  • fDate
    20-23 May 1990
  • Firstpage
    625
  • Abstract
    An equation was developed for use in the design of a molding compound with increased resistance to the popcorn (package cracking) phenomenon. After evaluating many kinds of raw materials to achieve the goal, the authors chose two resin systems; one resin system is low glass transition temperature, Tg, while the other is high T g. High-density filling with silica helped improve the antipopcorn properties. It is concluded that low-Tg molding compounds have obvious advantages over high-Tg molding compounds in terms of the antipopcorn property. From this study, the authors recommend low-Tg molding compounds that have low-S , low-E, low-Df, and high-σ properties to protect surface-mount devices from the popcorn phenomenon
  • Keywords
    encapsulation; packaging; printed circuit manufacture; surface mount technology; antipopcorn properties; glass transition temperature; molding compound; package cracking; popcorn phenomenon; resin systems; silica filling; surface mounting devices; surface-mount devices; Equations; Filling; Glass; Packaging; Raw materials; Resins; Silicon compounds; Surface cracks; Surface resistance; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1990. ., 40th
  • Conference_Location
    Las Vegas, NV
  • Type

    conf

  • DOI
    10.1109/ECTC.1990.122253
  • Filename
    122253