DocumentCode
1898058
Title
Special properties of molding compound for surface mounting devices
Author
Nishioka, T. ; Nagasaqa, M. ; Igarashi, K. ; Kohmoto, M. ; Ito, S.
Author_Institution
Nitto Denko Corp., Mie, Japan
fYear
1990
fDate
20-23 May 1990
Firstpage
625
Abstract
An equation was developed for use in the design of a molding compound with increased resistance to the popcorn (package cracking) phenomenon. After evaluating many kinds of raw materials to achieve the goal, the authors chose two resin systems; one resin system is low glass transition temperature, T g, while the other is high T g. High-density filling with silica helped improve the antipopcorn properties. It is concluded that low-T g molding compounds have obvious advantages over high-T g molding compounds in terms of the antipopcorn property. From this study, the authors recommend low-T g molding compounds that have low-S , low-E , low-D f, and high-σ properties to protect surface-mount devices from the popcorn phenomenon
Keywords
encapsulation; packaging; printed circuit manufacture; surface mount technology; antipopcorn properties; glass transition temperature; molding compound; package cracking; popcorn phenomenon; resin systems; silica filling; surface mounting devices; surface-mount devices; Equations; Filling; Glass; Packaging; Raw materials; Resins; Silicon compounds; Surface cracks; Surface resistance; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location
Las Vegas, NV
Type
conf
DOI
10.1109/ECTC.1990.122253
Filename
122253
Link To Document