DocumentCode
1898619
Title
SOI processing by epitaxial lateral overgrowth
Author
Subramanian, Chitra K. ; Neudeck, Gerold W.
Author_Institution
Purdue Univ., West Lafayette, IN, USA
fYear
1991
fDate
1-3 Oct 1991
Firstpage
132
Lastpage
133
Abstract
A SOI (silicon-on-insulator) process using ELO (epitaxial lateral overgrowth) is presented that can be used not only to create local area SOI islands but full wafer SOI as well. A thin full-wafer SOI structure formed with merged ELO has been demonstrated. With minor modification, this SOI process can be successively repeated to produce multiple layers of SOI for future three-dimensional application, since ELO has the advantages of low-temperature processing, ease of interlayer connection, and low cost. This process produces SOI material of very low defect density by using selective epitaxial growth of silicon as compared to other conventional SOI techniques
Keywords
integrated circuit technology; semiconductor epitaxial layers; semiconductor technology; semiconductor-insulator boundaries; 3D ICs; ELO; SOI processing; Si-SiO2; epitaxial lateral overgrowth; full wafer SOI; interlayer connection; local area SOI islands; low cost; low defect density; low-temperature processing; merged ELO; multiple layers of SOI; selective epitaxial growth; three-dimensional application; Costs; Epitaxial growth; Etching; Inductors; Merging; Planarization; Silicon; Strips; Substrates; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, 1991. Proceedings, 1991., IEEE International
Conference_Location
Vail Valley, CO
Print_ISBN
0-7803-0184-6
Type
conf
DOI
10.1109/SOI.1991.162892
Filename
162892
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