DocumentCode :
1898619
Title :
SOI processing by epitaxial lateral overgrowth
Author :
Subramanian, Chitra K. ; Neudeck, Gerold W.
Author_Institution :
Purdue Univ., West Lafayette, IN, USA
fYear :
1991
fDate :
1-3 Oct 1991
Firstpage :
132
Lastpage :
133
Abstract :
A SOI (silicon-on-insulator) process using ELO (epitaxial lateral overgrowth) is presented that can be used not only to create local area SOI islands but full wafer SOI as well. A thin full-wafer SOI structure formed with merged ELO has been demonstrated. With minor modification, this SOI process can be successively repeated to produce multiple layers of SOI for future three-dimensional application, since ELO has the advantages of low-temperature processing, ease of interlayer connection, and low cost. This process produces SOI material of very low defect density by using selective epitaxial growth of silicon as compared to other conventional SOI techniques
Keywords :
integrated circuit technology; semiconductor epitaxial layers; semiconductor technology; semiconductor-insulator boundaries; 3D ICs; ELO; SOI processing; Si-SiO2; epitaxial lateral overgrowth; full wafer SOI; interlayer connection; local area SOI islands; low cost; low defect density; low-temperature processing; merged ELO; multiple layers of SOI; selective epitaxial growth; three-dimensional application; Costs; Epitaxial growth; Etching; Inductors; Merging; Planarization; Silicon; Strips; Substrates; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, 1991. Proceedings, 1991., IEEE International
Conference_Location :
Vail Valley, CO
Print_ISBN :
0-7803-0184-6
Type :
conf
DOI :
10.1109/SOI.1991.162892
Filename :
162892
Link To Document :
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