Title :
Super-resolution detection of high-contrast embedded objects in structures using differential X-band sensor array
Author :
Tabib-Azar, Massood ; Zarycki, Joseph
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Case Western Reserve Univ., Cleveland, OH
Abstract :
We describe a non-ionizing imaging technique to detect highly conductive embedded objects inside of a poorly conducting structural material. We have constructed an array with four differential dasiapixelspsila each consisting of a pair of tuned, cross-polarized resonant microwave probes. The probes were individually tuned using dielectric loading and spatial tuning screws. The probes interact with the embedded wires in the structure causing a secondary resonance to form as detected using a network analyzer. The orthogonal polarization of the probes was used to perform differential measurements and to eliminate the effect of probe stand-off variations and surface non-uniformities. The experimental results demonstrated sensitivity to different diameters of embedded wires (with a minimum detectable signal of 1 mum at 100 mum depth) in a rubber structure. Individual broken wires could also be distinguished from a background of unbroken ones.
Keywords :
microwave detectors; microwave imaging; cross-polarized resonant microwave probes; dielectric loading; differential X-band sensor array; high-contrast embedded objects; network analyzer; orthogonal polarization; poorly conducting structural material; spatial tuning screws; super-resolution detection; Conducting materials; Dielectric materials; Microwave imaging; Object detection; Probes; Resonance; Sensor arrays; Signal resolution; Spatial resolution; Wires; Array; Imaging; Microwave; Nano-metrology; Near-field; Sensor; Tuneable Probe;
Conference_Titel :
Sensors, 2008 IEEE
Conference_Location :
Lecce
Print_ISBN :
978-1-4244-2580-8
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2008.4716614