Title :
SOI CMOS multi-sensors MEMS chip for aerospace applications
Author :
Mansoor, M. ; Haneef, I. ; Akhtar, S. ; Rafiq, M.A. ; Ali, S.Z. ; Udrea, F.
Author_Institution :
Inst. of Avionics & Aeronaut., Air Univ., Islamabad, Pakistan
Abstract :
In this paper, we report for the first time an SOI CMOS multi-sensors MEMS chip, capable of sensing three key flow parameters i.e. pressure, temperature and flow rate simultaneously. The chip contains an array of ten silicon diode temperature sensors, a piezoresistive pressure sensor and an array of nine micro hot-film flow rate sensors. The chip has been fabricated through a commercial CMOS foundry. The sensors have been embedded in thin oxide membranes that were obtained through a single, post-CMOS DRIE (deep reactive ion etching) back-etch step at the foundry. Characterization of each type of sensor was carried out using independent calibration setups. Temperature sensors exhibited a sensitivity of 1.6 mV/ °C at 1μA constant current in forward bias mode. Pressure sensor showed a sensitivity of 0.4734 mV/V/psi whereas the flow rate sensors showed typical third order calibration curve once operated in constant current mode. The chip can be used in micro-channels for micro-fluidic applications as well as on real aerodynamic surfaces and wind tunnel models for experimental verification of CFD results.
Keywords :
CMOS integrated circuits; aerospace engineering; calibration; constant current sources; elemental semiconductors; flow sensors; membranes; microfabrication; microsensors; piezoresistive devices; pressure sensors; sensor fusion; silicon; silicon-on-insulator; sputter etching; temperature sensors; CFD; SOI CMOS multisensor MEMS chip; Si; aerodynamic surface; aerospace application; constant current mode; current 1 muA; deep reactive ion etching; embedded thin oxide membrane; microchannel; microfluidic application; microhot-film flow rate sensor; piezoresistive pressure sensor; post-CMOS DRIE back-etching; silicon diode temperature sensor; third order calibration curve; wind tunnel model; Micromechanical devices; Sensitivity; Sensor phenomena and characterization; Temperature measurement; Temperature sensors; CMOS; DRIE; Dense sensor packing; Diode temperature sensor; Fluid dynamics; MEMS; Multi-sensor; Piezoresistive pressure sensor; SOI; Sensor system; Thermal flow rate sensor; Thermodiode;
Conference_Titel :
SENSORS, 2014 IEEE
Conference_Location :
Valencia
DOI :
10.1109/ICSENS.2014.6985225